UFO Probe Card Solutions for testing Photonic Integrated Circuits (PICs)
UFO Probe Technology allows time-saving parallel testing of optical and electrical components on wafers with just one probe card. Whether in cantilever or vertical version, it combines an alignment-insensitive optical concept with proven needle technology.
Optical Shaft Measuring Technology
The Opticline measuring systems are specifically designed for use in tough production environments. They are extremely robust and impervious to external influences, and offer integrated self-monitoring to ensure maximum system availability.
Optical 3D Measuring Technology
We offer optical 3D scanners based on structured-light projection technology for highly accurate, automated part inspection. The FLEX-3A product line is designed for incoming goods inspection, toolmaking, initial sampling and release, as well as automated inspection during production.
Liquid Crystal Spatial Light Modulators (SLM)
Liquid crystal light modulators are excellently suited for modulating the phase, amplitude, or polarization state of a light wave. They are based on the electrical control of the optical properties of a nematic liquid crystal layer.
Precision at Every Stage
